Conferences
International Conferences
[1] I. Yun, H. Menkara, J. Kolnik, I. Oguzman, K. Brennan, G. May, C. Summers, and B. Wagner, “Reliability Assessment of Multiple Quantum Well Avalanche Photodiodes,” Proc. Int. Reliab. Phys. Sym. (IRPS), April 1995. _ [논문 링크]
[2] I. Yun and G. May, “Evaluating the Manufacturability of GaAs/AlGaAs Multiple Quantum Well Avalanche Photodiodes Using Neural Networks,” Proc. 21st International Electronics Manufacturing Technology Symposium, Austin, Texas, pp. 105-112, Oct. 1997. [논문 링크]
[3] I. Yun and G. May, "Passive Circuit Model Parameter Extraction Using Genetic Algorithms," Proc. 49th Electronic Components and Technology Conference, San Diego, CA, pp. 1021-1024, 1999. [논문 링크]
[4] I. Yun and R. Poddar, L. Carastro, M. Brooke, and G. May, "Statistical Analysis of Embedded Capacitors using Monte Carlo Simulation," Proc. 50th Electronic Components and Technology Conference, Las Vegas, NV, pp. 198-205, 2000. [논문 링크]
[5] Kyung-Sook Hyun, Byeung-Su Yoo, Jeong-Soo Kim, and Ilgu Yun, “1/spl times/8 channel power splitter using multimode interference couplers in InP/InGaAsP,” Conf. Digest of Lasers and Electro-Optics Europe (LEOS Europe), September 2000. [논문 링크]
[6] C. Park, S. Kang, I. Yun, K. Hyun, and E. Lee, “InP/InGaAs based hi-lo avalanche photodetectors for high-speed optical communications (Invited Paper),” Proc. SPIE, vol. 4288, Jan. 2001. [논문 링크]
[7] K. S. Hyun, Y. H. Kwon, J. S. Kim, and I. Yun, “Gain-Bandwidth Product Characterization of InP/InGaAs Avalanche Photodiode for 10 Gbps Optical Receiver,” Proc. 2nd Korea-Japan Joint Workshop on Microwave Photonics, pp. 149-152, Feb. 2001. [논문 링크]
[8] Young-Don Ko, Kyu-Hyun Bang, Min-Chul Park, Kwang-Soo Huh, Jae-Min Myoung, and Ilgu Yun, “p-ZnO Thin Film Formation on Si using Zn3P2 Diffusion,” ICEE Symposium, Jeju Island, Korea, July 2002. [논문 링크]
[9] J. Jung, Y. Kwon, K. Hyun, and I. Yun, “Reliability testing of single diffused plannar InP/InGaAs avalanche photodiodes,” 27th IEMT Symposium, San Jose, CA, July 2002. [논문 링크]
[10] S. Lee, J. Choi, G. May, and I. Yun, “Investigation of 3-D embedded inductors using Monte Carlo analysis,” 27th IEMT Symposium, San Jose, CA, July. 2002. [논문 링크]
[11] K. Hyun, I. Yun, and E. Lee, “High-speed, high-reliable InP/InGaAs avalanche photodiode for optical communications (Invited Paper),” Proc. SPIE, vol. 4999, Jan. 2003. [논문 링크]
[12] Han Sung Joo, Su Chang Jeon, Bongyong Lee, Yong Hwan Kwon, Joong-Seon Choe, and Ilgu Yun, “Reliability testing of InGAAs Mesa structure waveguide photodiodes for 40-Gb/s optical receiver applications,” 2004 IMFEDK, Kyoto, july. 2004. [논문 링크]
[13] Myoung-Seok Kim, Young-Don Ko, Tae-Hyoung Moon, Min-Chang Jeong, Jae-Min Myoung, and Ilgu Yun, “Effect on the electrical properties of HfO2 films grown by metal-organic molecular beam epitaxy,” 2004 IMFEDK, Kyoto, july. 2004. [논문 링크]
[14] Kilhan Kim, Changhoon Oh, Jisoo Chang, Gunhee Han and Ilgu Yun, “Modeling of octagonal spiral inductors for integrated circuit applications,” 2004 IMFEDK, Kyoto, july. 2004. [논문 링크]
[15] Su Chang Jeon, Han Sung Hoo, Bongyong Lee, Joong-seon Choe, Yong Hwan Kwon and Ilgu Yun, “Modeling and O/E Chatacterization of 40Gbps InGaAs Side-Illuminated Waveguide photodiode and Submodule for Optical Receivers,” 2004 IMFEDK, Kyoto, july. 2004. [논문 링크]
[16] Young-Don Ko, Hong Seok Kang, Min-Chang Jeong, Sang yeol Lee, Jae-Min Myoung, and Ilgu Yun, “Neural network based Modeling for the Growth rate of ZnO thin films on the pulsed laser deposition,” 2004 IMFEDK, Kyoto, july. 2004. [논문 링크]
[17] Young-Don Ko, Jeoung-Yeon Hwang, Dae-Shik Seo, Ilgu Yun, “Modeling of the Cell Gap Process Characteristic on the Polymer Substrate for Flexible Liquid Crystal Display Applications,” IMID `05 DIGEST, Seoul, july. 2005. [논문 링크]
[18] Y.-D. Ko, J. H. Lee, K. E. Kweon, T.-H. Moon, J.-M. Myoung, I. Yun, “PCA-based Neural Network Modeling of MBE-grown HFO2 Thin Film Characteristics” `05 EDSSC, hongkong, December. 2005. [논문 링크]
[19] S. C. Jeon, Y. D. Chung, Y. S. Kang, J.Kim, I. Yun, “Modeling of traveling wave Electro-absorption modulator for high speed optical communication system” `05 EDSSC, hongkong, December. 2005. [논문 링크]
[20] Jung Hwan Lee, Young-Don Ko, Min-Chang Jeong, Jae-Min Myoung, and Ilgu Yun, "PCA-Based Neural Network Modeling Using the Photoluminescence Data for Growth Rate of ZnO Thin Films Fabricated by Pulsed Laser Deposition" `06 ISNN, Chengdu, may. 2006. [논문 링크]
[21] S. I. Jung, H. Y. Yeo, I. Yun, J. Y. Leem, I. K. Han, J. S. Kim and J. I. Lee, "High potential barrier effects on self-assembled InAs quantum dots" The 13th International Symposium on the Physics of Semiconducotors and Applications, jeju, Aug., 2006. [논문 링크]
[22] S. I. Jung, H. Y. Yeo, I. Yun, J. Y. Leem, I. K. Han, J. S. Kim and J. I. Lee, "Size distribution effects on self-assembled InAs quantum dots" International Conference on Optical and Optoelectronic Properties of Materials and Applications, Darwin, July, 2006. [논문 링크]
[23] S. I. Jung, H. Y. Yeo, I. Yun, J. Y. Leem, I. K. Han, J. S. Kim and J. I. Lee, "Near-field scanning optical microscopy of quantum dot broad area laser diodes" International Conference on Optical and Optoelectronic Properties of Materials and Applications, Darwin, July, 2006. [논문 링크]
[24] H.Y. Yeo, S.I. Jung, I. Yun, J.I. Lee, "Synthesis and optical characteristics of ZnS overcoated CdSe nanocrystals" International Conference on Superlattices, Nano-structures and Nano-devices, Istanbul, July, 2006. [논문 링크]
[25] S. I. Jung, H. Y. Yeo, I. Yun, J. Y. Leem, I. K. Han, J. S. Kim and J. I. Lee, "Near-field emission properties of self-formed InAs quantum dot laser diode by near-field scanning optical microscopy" The 13th International Symposium on the Physics of Semiconducotors and Applications, jeju, Aug., 2006. [논문 링크]
[26] H.Y. Yeo, S.I. Jung, I. Yun, J.I. Lee, I.K Han , "Photoluminescence characteristics of epitaxial lateral and vertical overgrowth of GaN on patterned Si substrate" 11th International Conference on Defects : Recognition, Imaging and Physics in Semiconductors, Beijing, sep., 2006. [논문 링크]
[27] S.I. Jung, H.Y. Yeo, I.Yun, I.K. Han, and J.I. Lee, " Near-field measurement of quantum dot broad area laser diodes by utilizing near-field scanning optical microscope: Effects of the linewidth enhancement factor on filamentation", NMDC 2006, Gyeongju, Korea, Oct. 22-25, 2006. [논문 링크]
[28] Young-Don Ko, Moon-Ho Ham, Jae-Min Myoung, and Ilgu Yun, "EFFECT OF THE PRINCIPAL COMPONENT ON THE PCA-BASED NEURAL NETWORK MODEL FOR HFO2 THIN FILM CHARACTERISTICS ," The IASTED International Conference on Artificial Intelligence and Applications (AIA 2007), Innsbruck, Austria, Feb., 2007. [논문 링크]
[29] Keun Ho Rhew, Su Chang Jeon, O-Kyun Kwon, Dae Hee Lee, Byung Soo Yoo, and Ilgu Yun, "Reliability Assessment of 1.55-um Vertical Cavity Surface Emitting Lasers for Optical Communication Systems," Proc. Int. Reliab. Phys. Sym. (IRPS), Phoenix, U.S.A, April 2007. [논문 링크]
[30] S. I. Jung, I. Yun, and J. I. Lee"Optical Characteristics of CdSe Quantum Dots Depending on Growth Conditions and Surface Passivation", 18th ICMED, Daejeon, Korea, May 2007. [논문 링크]
[31] Young-Don Ko, Jung Hwan Lee, Moon-Ho Ham, Jaejin Jang, Jae-Min Myoung, and Ilgu Yun, "Comparison of PCA-based Neural Network Models using the Screening of X-ray Diffraction Data for MOMBE-grown HfO2 Thin Film Characteristics," 11th Int’l Conf. on Intelligent Engineering Systems(INES 2007) pp.115-120, Budapest, Hungary, 29 June-1 July, 2007. [논문 링크]
[32] Soon Il Jung, Ilgu Yun and Joo In Lee, "Fabracation and optical properties of CdSe/ZnS core/shell quantum dots and hybrid organic/inorganic light emitting diode," The 13th International Conference on Ⅱ-Ⅵ Compounds, P.396, Korea, September 10-14, 2007. [논문 링크]
[33] Soon Il Jung, Ilgu Yun, Sung M. Cho, Il Ki Han, and Joo In Lee, "Optical properties of CdSe/ZnS core/shell quantum dots depending on growth conditions", MRS Fall Meeting, Boston, U.S.A, ,November 25-30, 2007. [논문 링크]
[34] Young-Don Ko, Pyung Moon, Chang Eun Kim, Moon-Ho Ham, Jae-Min Myoung, and Ilgu Yun, " PCA-based Network Modeling using Standardized X-ray Diffraction Data for the Electrical Characteristics of the HfO2 Thin Films Grown by MOMBE", ISDRS 2007, MD, U.S.A, December 12-14, 2007. [논문 링크]
[35] Soon Il Jung, and Ilgu Yun , "Optical properties of Au-CdSe/ZnS quantum dot quantum well structures," International Conference on Semiconductor Quantumdot, Gyeongju, Korea, May, 11-16, 2008. [x]
[36] Chulhyun Park, Junghan Kang, Seong-Ook Jung, and Ilgu Yun, "Variation Analysis of DC Characteristics for Multi-Finger MOSFETS," Proceedings of ICEIC2008, Tashkent, Uzbekistan, pp. 327-329, June 24-27 2008. [논문 링크]
[37] Soon Il Jung, and Ilgu Yun , "Optical properties of self-assembled InAs quantum dot superluminescent diodes," International Symposium on the Physics of Semiconductors and Applications, Jeju, Korea, Aug, 26-29, 2008. [x]
[38] Pyung Moon, Changeun Kim, and Ilgu Yun, "Ink-jet Printing Process Modeling using Neural Networks", IEMT 2008, Penang, Malaysia, Nov. 4-7, 2008 [x]
[39] Hyuksang Yim, Junghan Kang, and Ilgu Yun, "Variability Modeling of RF Characteristics for Multi-finger MOSFETs using Statistical Methods", IEMT 2008, Penang, Malaysia, Nov. 4-7, 2008. [x]
[40] Chulhyun Park, Junghan Kang, and Ilgu Yun, "Statistical modeling of layout-dependent characteristic fluctuations for multi-finger MOSFETs", EDSSC 2008, Hongkong, China, Dec. 8-10, 2008. [논문 링크]
[41] Joonkyu Park, and Ilgu Yun, "Modeling of avalanche gain for high-speed InP/InGaAs Avalanche photodiodes", EDSSC 2008, Hongkong, China, Dec. 8-10, 2008. [논문 링크]
[42] Changeun Kim, Pyung Moon, and Ilgu Yun, "Modeling of Thermal Annealing of ZnO:Ga Thin Films for Transparent Conductive Oxide using Neural Networks", AIA 2009, Innsbruck, Austria, Feb. 15-18, 2009. [x]
[43] Jung Han Kang, Chang Eun Kim, Myoung-Seok Kim, Jae-Min Myoung and Ilgu Yun, "Material characterization and process modeling issues of high-k dielectrics for FET applications", NMDC2009, Traverse city, Michigan, USA, June 2-5, 2009. [x]
[44] Chang Eun Kim, Pyung Moon, Sungyeon Kim, Hyeon Woo Jang, Jungsik Bang, Jae-Min Myoung and Ilgu Yun, "Optical Bandgap Modeling of Thermal Annealed ZnO:Ga Thin Films using Neural Networks", EMRS spring meeting 2009, Strasbourg, France, June 8-12, 2009. [x]
[45] Jung Han Kang, Chul Hyun Park, Kyeong-Ju Moon, Jae-Min Myoung, and Ilgu Yun, “Geometry dependent characterization of GaN nanowire FET with PE-ALD grown Ta2O5 dielectric layer”, ICMAP 2009, Busan, Korea, Sep. 22-25, 2009. [논문 링크]
[46] Chang Eun Kim, Pyung Moon, Sungyeon Kim, Hyeon Woo Jang, Jungsik Bang, Jae-Min Myoung, and Ilgu Yun, “Effect of carrier concentration on optical bandgap shift in ZnO:Ga thin films”, ICMAP 2009, Busan, Korea, Sep. 22-25, 2009. [논문 링크]
[47] Edward Namkyu Cho, Chang Eun Kim, Pyung Moon, Sungyeon Kim, Hyeon Woo Jang, Jungsik Bang, Jae-Min Myoung, and Ilgu Yun, “Low temperature processing effects of ZnO:Ga thin films for transparent conductive oxides”, ICAMP 2009, Busan, Korea, Sep. 22-25, 2009. [논문 링크]
[48] Chang Eun Kim, Pyung Moon, Edward Namkyu Cho, Sungyeon Kim, Jae-Min Myoung, and Ilgu Yun, "Electrical Characterization and Conduction Mechanism of High-k Ti1-xSixO2 Gate Dielectrics", IEEE INEC 2010, Hong Kong, China, January 3-8, 2010. [논문 링크]
[49] Youngkyu Song, Chulhyun Park, Junghan Kang, Ik-Bu Sohn, Young-Chul Noh, Jongmin Lee, Eung Jang Lee, Seung-Han Park, Soogil Lee, Jongill Hong, and Ilgu Yun, "Effects of Laser Drilling through Silicon Substrate on MOSFET Device Characteristics", IEEE INEC 2010, Hong Kong, China, January 3-8, 2010. [논문 링크]
[50] Myoung Yone Seo, Edward Namkyu Cho, Chang Eun Kim, Pyung Moon, and Ilgu Yun, "Characterization of Al2O3 Films grown by Electron Beam Evaporator on Si Substrates", IEEE INEC 2010, Hong Kong, China, January 3-8, 2010. [논문 링크]
[51] Pyung Moon, Yongan Lee, Chang Eun Kim, Jungmok Seo, Taeyoon Lee, and Ilgu Yun, "Modeling of Tapered Reactive Ion Etching Process of SiO2 Layer using Neural Networks ", ICEP 2010, Sapporo, Japan, May 12-14, 2010. [논문 링크]
[52] Youngkyu Song, Chulhyun Park, Jung Han Kang, and Ilgu Yun, "Frequency-dependent Characterization of Multi-finger MOSFETs with Different Gate Structures", ICEP 2010, Sapporo, Japan, May 12-14, 2010. [논문 링크]
[53] Edward Namkyu Cho, Jung Han Kang, Youngkyu Song, and Ilgu Yun, "Modeling of Amorphous InGaZnO TFTs with Channel Width and Length Variations", ICEP 2010, Sapporo, Japan, May 12-14, 2010. [논문 링크]
[54] Jung Han Kang, Edward Namkyu Cho, and Ilgu Yun, "Current stress instability analysis of amorphous InGaZnO thin film transistors", SSDM 2010, Tokyo, August 22-24, 2010. [논문 링크]
[55] Chang Eun Kim, Pyung Moon, Edward Namkyu Cho, and Ilgu Yun, "TiN Metal Nanocrystal Using HfO2 and Al2O3 Oxides ", IWDTF-11, Tokyo, January 20-21, 2011. [논문 링크]
[56] Suehye Park, Edward Namkyu Cho, Chang Eun Kim, and Ilgu Yun, "Modeling of Gate Dielectric Structure Variations in Amorphous InGaZnO TFTs ", IWDTF-11, Tokyo, January 20-21, 2011. [논문 링크]
[57] Edward Namkyu Cho, Jung Han Kang, and Ilgu Yun, "Effects of channel thickness variation on bias stress instability of InGaZnO thin-film transistors", ESREF 2011, Bordeaux, France, October 3-7, 2011. [논문 링크]
[58] Suehye Park, Edward Namkyu Cho, and Ilgu Yun, "Effect of Gate Stress Time Duration on Threshold Voltage for Amorphous InGaZnO Thin Film Transistor Characteristics", ICEIC 2012, Jeongseon, Korea, February 1-3, 2012. [논문 링크]
[59] Jun Yeong Lim, Pyung Moon and Ilgu Yun, "Effect of Inter-poly Dielectric Thickness Variation on Flat Band Voltage Shift in Flash Memory Applications", ICEIC 2012, Jeongseon, Korea, February 1-3, 2012. [논문 링크]
[60] Chang Eun Kim, and Ilgu Yun, "Effects of the Interfacial Layer on Electrical Properties of TiO2-based High-k Dielectric Composite Films", 221st ECS Meeting, Seattle, U.S.A, May 6-10, 2012. [논문 링크]
[61] Suehye Park, Edward Namkyu Cho, and Ilgu Yun, "Effects of Alternating Pulse Bias Stress on Amorphous InGaZnO Thin Film Transistors", 221st ECS Meeting, Seattle, U.S.A, May 6-10, 2012. [논문 링크]
[62] Jun Yeong Lim, Pyung Moon and Ilgu Yun, "Effects of type and density of interface trap in tunneling oxide for flash memory devices", 2012 IEEE International Conference on Electron Devices and Solid State Circuits (EDSSC 2012), Bangkok, Thailand, Dec. 3-5, 2012. [논문 링크]
[63] Yong Hyeon Shin, Jung Han Kang, Ilgu Yun, "Green's function based 2-D MOSFET modeling for random dopant fluctuation", 2012 IEEE International Conference on Electron Devices and Solid State Circuits (EDSSC 2012), Bangkok, Thailand, Dec. 3-5, 2012. [논문 링크]
[64] Suehye Park, Edward Namkyu Cho, and Ilgu Yun, "Instability of Light Illumination Stress on Amorphous InGaZnO Thin Film Transistors", The 19th International Display Workshops in conjunction with Asia Display 2012 (IDW/AD '12), Kyoto, Japan, Dec. 4-7, 2012. [논문 링크]
[65] Suehye Park, Edward Namkyu Cho, and Ilgu Yun, "Instability Assessment and Modeling of Amorphous InGaZnO Thin Film Transistors under Alternating Pulse Bias Stresses", China Semiconductor Technology International Conference 2013 (CSTIC 2013), Shanghai, China, March 17-18, 2013. (Invited) [논문 링크]
[66] Jung Han Kang, Edward Namkyu Cho, and Ilgu Yun, "In-Situ Threshold Voltage Shift Monitoring of Amorphous InGaZnO Thin-Film Transistors", The 20th International Display Workshops (IDW '13), Sapporo, Japan, Dec. 4-6, 2013. [논문 링크]
[67] Pyung Moon, Jun Yeong Lim, Tae-Un Youn, Keum-Whan Noh, Sung-Kye Park, and Ilgu Yun, "Methodology for improvement of data retention in floating gate flash memory using leakage current estimation", ESREF 2013, Archachon, France, September 30 - October 4, 2013. [논문 링크]
[68] Dongseok Shin, Edward Namkyu Cho, Suehye Park, and Ilgu Yun, "Effect of SiOx/SiNx stacked gate dielectric structure on the instability of a-IGZO thin film transistors", China Semiconductor Technology International Conference 2014 (CSTIC 2014), Shanghai, China, March 16-17, 2014. [논문 링크]
[69] Edward Namkyu Cho, Yong Hyeon Shin, Pyung Moon, and Ilgu Yun, "Modeling of Subthreshold Characteristics for Double Gate MOSFET using Neural Networks and Genetic Algorithm", China Semiconductor Technology International Conference 2014 (CSTIC 2014), Shanghai, China, March 16-17, 2014. [논문 링크]
[70] Jun Yeong Lim, Pyung Moon, Sang Myung Lee, and Ilgu Yun, "Analysis of Intrinsic Retention Characteristics for 2x-nm NAND Flash Memory using TCAD Simulation", China Semiconductor Technology International Conference 2014 (CSTIC 2014), Shanghai, China, March 16-17, 2014. [논문 링크]
[71] Yong Hyeon Shin, Sang Myung Lee, and Ilgu Yun, "Effect of Tilted Angle in Trench Structure on Phase Change Memory Operation using TCAD Simulation", China Semiconductor Technology International Conference 2014 (CSTIC 2014), Shanghai, China, March 16-17, 2014. [논문 링크]
[72] Sang Myung Lee, Yong Hyeon Shin, and Ilgu Yun, "Effect of Trench Depth Variation on Phase Change Memory Operation using TCAD simulation", China Semiconductor Technology International Conference 2014 (CSTIC 2014), Shanghai, China, March 16-17, 2014. [논문 링크]
[73] Dongseok Shin, Sang Myung Lee, and Ilgu Yun, "Modeling and Simulation of Flexible Oxide Thin Film Transistors", International Electron Devices and Materials Symposium 2014 (IEDMS 2014), Hualien, Taiwan, November 20-21, 2014. [논문 링크]
[74] Sang Myung Lee, Dongseok Shin, and Ilgu Yun, "The Experiment Observation of Cyclic Bending Stress on Flexible a-IGZO TFT with Various Bending Radius", International Electron Devices and Materials Symposium 2014 (IEDMS 2014), Hualien, Taiwan, November 20-21, 2014. [논문 링크]
[75] Edward Namkyu Cho, Jung Han Kang, Suehye Park, and Ilgu Yun, "Geometry-dependent Variability Analysis of Amorphous InGaZnO TFT by Parameter Extraction using Capacitance-Voltage Measurements", International Conference on Electronics, Information and Communication 2015 (ICEIC 2015), Singapore, January 28-31, 2015. [논문 링크]
[76] Jun Yeong Lim, Yong Hyeon Shin, and Ilgu Yun, "Effects of Trap Density in GeSbTe material for Phase-Change Memory", International Conference on Electronics, Information and Communication 2015 (ICEIC 2015), Singapore, January 28-31, 2015. [논문 링크]
[77] Yong Hyeon Shin, Edward Namkyu Cho, and Ilgu Yun, "Sensitivity Analysis for Random Dopant Fluctuation in DG MOSFET using Regression Model", International Conference on Electronics, Information and Communication 2015 (ICEIC 2015), Singapore, January 28-31, 2015. [논문 링크]
[78] In Joong Kim, Yong Hyeon Shin and Ilgu Yun, "Modeling of positional plasma characteristics by inserting body tube of optical emission spectroscopy for plasma assisted atomic layer deposition system". In Electronics Packaging and iMAPS All Asia Conference (ICEP-IACC), 2015 International Conference on (pp. 638-641). IEEE.. [논문 링크]
[79] Jun Yeong Lim, and Ilgu Yun, "Reliability Modeling and Analysis of Flicker Noise for Pore Structure in Amorphous Chalcogenide-based Phase-Change Memory Devices", ESREF 2015, Toulouse, France, October 5 -9, 2015. [논문 링크]
[80] Yong Hyeon Shin, Edward Namkyu Cho, and Ilgu Yun, "Channel Doping-dependent Thermal and Flicker Noise Compact Model in Double Gate MOSFET under Weak Inversion Region", International Electron Devices and Materials Symposium 2015 (IEDMS 2015), Tainan, Taiwan, November 19-20, 2015. [논문 링크]
[81] Min Soo Bae, and Ilgu Yun, "Effect of EOT and Bulk Oxide Traps on HfO2/SiO2 Double Gate MOSFETs", International Electron Devices and Materials Symposium 2015 (IEDMS 2015), Tainan, Taiwan, November 19-20, 2015. [논문 링크]
[82] Dongseok Shin, Sang Myung Lee, and Ilgu Yun, "Effect of Process Parameters on Hard Coating Film Characteristics in Roll-to-Roll Printing Process system", International Conference on Electronics Packaging 2016 (ICEP 2016), Sapporo, Japan, April 20-22, 2016. [논문 링크]
[83] Sang Myung Lee, Dongseok Shin, and Ilgu Yun, "Characterization Methodology of Transparent Hard Coating Film on Transparent Substrates using Capacitance-Voltage Measurement", International Conference on Electronics Packaging 2016 (ICEP 2016), Sapporo, Japan, April 20-22, 2016. [논문 링크]
[84] Dongseok Shin, Min Soo Bae, and Ilgu Yun, "Instability of oxide thin film transistor under electrical-mechanical hybrid stress for foldable display", ESREF 2016, Halle, Germany, September 19-22, 2016. [논문 링크]
[85] Sang Myung Lee, Chuntaek Park, and Ilgu Yun, "Crack-guided effect on dynamic mechanical stress for foldable low temperature polycrystalline silicon thin film transistors", ESREF 2016, Halle, Germany, September 19-22, 2016. [논문 링크]
[86] In Joong Kim, and Ilgu Yun, "Plasma abnormality detection using a wide-angle lens for process reliability enhancement", International Electron Devices and Materials Symposium 2016 (IEDMS 2016), Tainan, Taiwan, November 24-25, 2016. [논문 링크]
[87] Min Soo Bae, and Ilgu Yun, "Influence of grain boundary position on on-current of low-temperature polycrystalline silicon driving thin-film transistors for AMOLED display", International Electron Devices and Materials Symposium 2016 (IEDMS 2016), Tainan, Taiwan, November 24-25, 2016. [논문 링크]
[88] Chuntaek Park, and Ilgu Yun, "The effect of gate separation on low-temperature polycrystalline silicon thin-film transistors by mechanical stress", International Electron Devices and Materials Symposium 2016 (IEDMS 2016), Tainan, Taiwan, November 24-25, 2016. [논문 링크]
[89] Min Soo Bae, and Ilgu Yun, "Degradation behavior of LTPS thin film transistors by static mechanical stresses with different folding directions", International Technical Conference on Circuits/Systems, Computers and Communications, Busan, Korea, July 2-5, 2017. [논문 링크]
[90] Sang Myung Lee, and Ilgu Yun, "Effect of selectively passivated layer on foldable low temperature polycrystalline silicon thin film transistors characteristics under dynamic mechanical stress", ESREF 2017, Bordeaux, France, September 25-28, 2017. [논문 링크]
[91] Dongseok Shin, Byougchoul Park, Youngcheol Chae, and Ilgu Yun, “Structure variation effects on device reliability of single photon avalanche diodes”, ESREF 2017, Bordeaux, France, September 25-28. 2017. [논문 링크]
[92] Chuntaek Park, and Ilgu Yun, “Mechanical stress-induced degradation model of amorphous InGaZnO thin film transistors by strain-initiated defect generation”, ESREF 2017, Bordeaux, France, September 25-28. 2017. [논문 링크]
[93] Min Soo Bae, Chuntaek Park, and Ilgu Yun, “Compact Drain Current Model of Nanoscale FinFET Considering Short Channel Effect in Ballistic Transport Regime”, SMACD 2018, Prague, Czech republic, July 2-5. 2018.
[94] Sang Myung Lee, and Ilgu Yun, “Modeling and Simulation of Novel GaN-based Light Emitting Transistor for Display Applications”, PRIME 2018, Prague, Czech republic, July 2-5. 2018.
[95] Youkyoung Jee, Dongseok Shin, Byungchoul Park, Youngcheol Chae, and Ilgu Yun, “Effect of different guard ring structures on electrical and thermal characteristics of single photon avalanche diodes”, IEDMS 2018, Keelung, Taiwan, November 14-16. 2018. [논문 링크]
[96] Donghwan Lee, Ilgu Yun, “Investigation of cell characteristics according to cell plug profile variation for 3D NAND FLASH Memory”, AWAD 2019, Busan, Korea, July 1-3. 2019.
[97] Ji-seok Lee, and Ilgu Yun, "Extraction of Time and Temperature Dependent Retention Characteristics in TANOS structure", AWAD 2019, Busan, Korea, July 1-3. 2019.
[98] In Joong Kim, and Ilgu Yun, "Selective Plasma Light Intensity Measurement Technique for Process Uniformity using Transparent LCD Module adapted Optical Emission Spectroscopy", ICPIG & ICRP-10, Sapporo, Japan, July 14-19. 2019.
[99] Min soo Bae, and Ilgu Yun, “Compact Modeling of the Subthreshold Characteristics of Generalized Strucutrues of Junctionless Double-Gate FETs", International Electron Devices and Materials Symposium 2019 (IEDMS 2019), Chang-gung University, Taiwan, October 24-25, 2019.
[100] Cheontaek Park, and Ilgu Yun, “Degradation of Off-Phase Leakage Current of Gate-All-Around DETs Induced by Self-Heating Effect in High-Frequency Operation Regime”, International Electron Devices and Materials Symposium 2019 (IEDMS 2019), Chang-gung University, Taiwan, October 24-25, 2019.
[101] Jae Hun Kim, and Ilgu Yun, “A GaN-based Thin Film Light Emitting Transistor for Future Display Technologies”, International Electron Devices and Materials Symposium 2019 (IEDMS 2019), Chang-gung University, Taiwan, October 24-25, 2019.
[102] Dongseok Shin, Byougchoul Park, Youngcheol Chae, and Ilgu Yun, “Model-based guard ring structure guideline for the enhancement of silicon-based single photon avalanche diode characteristics”, SPIE Photonics West OPTO, San Francisco, California, United States, Feburary 1-6. 2020.
[103] Ji-seok Lee, and Ilgu Yun, “Analysis of Mechansism about Data Retention Characteristicss in TANOS Structure”, 25th Annual SMTA Pan Pacific Microelectronics Symposium, Honolulu, Oahu, Hawaii, USA, Feburary 10-13. 2020.
[104] Min soo Bae, and Ilgu Yun, “Design optimization of Gaussian doped junctionless FinFET with interface traps”, International Electron Devices and Materials Symposium 2020 (IEDMS 2020), Chang-gung University, Taiwan, October 14-15, 2020.
[105] Chuntaek Park, and Ilgu Yun, “Thermal characteristics modeling of gate-all-around field-effect transistors using neural networks”, International Electron Devices and Materials Symposium 2020 (IEDMS 2020), Chang-gung University, Taiwan, October 14-15, 2020.
[106] Seungju Hwang, and Ilgu Yun, “Modeling and simulation of layout-defined voltage-scalable double-gate FinFET for over 5-V applications”, International Electron Devices and Materials Symposium 2020 (IEDMS 2020), Chang-gung University, Taiwan, October 14-15, 2020.
[107] Jae Hun Kim, and Ilgu Yun, "Analysis of Electrical Characteristics Induced by Lattice Mismatches of a GaN-based Light Emitting Transistor", The 36th International Technical Conference on Circuits/Systems, Computers and Communications, Jeju, Republic of Korea, June 28-30, 2021.
[108] Dongseok Shin, Hyejeong Choi, Byougchoul Park, Youngcheol Chae and Ilgu Yun, "Size Effect of Deep Virtual Guard Ring on the Characteristic of Silicon Single Photon Avalanche Diodes", The 36th International Technical Conference on Circuits/Systems, Computers and Communications, Jeju, Republic of Korea, June 28-30, 2021.
[109] Semyung Kwon, Seonyeong Park, Hyungjun Kim and Ilgu Yun, "Growth Modeling of High-k Dielectrics using Plasma-enhanced Atomic Layer Deposition", International Conference on Electronics, Information and Communication (ICEIC) 2022, Jeju, Republic of Korea, June 28-30, 2021.
[110] Seungju Hwang and Ilgu Yun, "Self-Heating Effect of GAAFET and FinFET for over 2-V Application using TCAD Simulation", International Conference on Electronics, Information and Communication (ICEIC) 2022, Jeju, Republic of Korea, June 28-30, 2021.
[111] Jinwoo Kim and Ilgu Yun, "Trap-density Dependent Performance Variations in V-NAND Structure using TCAD simulation", The 20th International Symposium on the Physics of Semiconductors and Applications, Jeju, Republic of Korea, July 17-21, 2022.
[112] Dongyoun Kim, Seunggyu Na, Hyungjun Kim,and Ilgu Yun, "Cycle-to-cycle Effect of PE-ALD Process using OES for Uniformity Diagnosis", The 20th International Symposium on the Physics of Semiconductors and Applications, Jeju, Republic of Korea, July 17-21, 2022.
[113] Haewon Lee, Dongseok Shin, Hyejeong Choi, and Ilgu Yun, "Junction Desgin Guideline of Silicon Single-Photon Avalanche Diodes for Edge Breakdown Suppression", IEEE Photonics Conference, Vancouver, Canada, November 13-17, 2022.
[114] Dongyoun Kim, Seunggyu Na, Hyungjun Kim, Ilgu yun, "Virtual Metrology Scheme for Predictive Plasma Uniformity Diagnosis of Plasma-Enhanced Atomic Layer Deposition Process using Optical Emission spectroscopy", SPIE Photonics West OPTO, San Francisco, California, United States, Jan.y 28- Feb. 2. 2023.
[115] Haewon Lee, Dongseok Shin, Hyejeong Choi and Ilgu Yun, "Design Risk for Fabrication Stability of Silicon Single-Photon Avalanche Diodes with Deep N-well Implantation", SPIE Photonics West OPTO, San Francisco, California, United States, Jan.y 28- Feb. 2. 2023.
[116] Ilgu Yun, “Mermory Device Reliability Modeling of V-NAND Using Calibrated Technology Computer-Aided Design”, International Conference on Electronics, Information, and Communication 2024 (ICEIC 2024), Taiwan, January 28- 31, 2024.
[117] Yeonseok Han, and Ilgu Yun, “Comparison of Stress Effects Between Constant-Stress and Step-Stress Tests for Planar InP/InGaAs Avalanche Photodiodes”, International Conference on Electronics, Information, and Communication 2024 (ICEIC 2024), Taiwan, January 28- 31, 2024.
[118] Heewon Bang, and Ilgu Yun, “Analysis of Nonuniformity-Aware Degradation for Single-Photon Avalanche Diodes for Solid-State Photomultiplier Using SPICE Modeling”, International Conference on Electronics, Information, and Communication 2024 (ICEIC 2024), Taiwan, January 28- 31, 2024.
Domestic Conferences
[1] 윤일구, 현경숙, 편광의, “고속 광수신소자 제작을 위한 Zinc 확산 공정 연구,” 한국 전기전자재료학회 하계학술대회, 용평, pp. 731-734, July 2000. [논문 링크]
[2] 고영돈, 정지훈, 윤일구, “고속 애벌랜치 포토다이오드 제작을 위한 확산 공정의 신경망 모델링,” 한국 전기전자재료학회 하계학술대회, 무주, pp. 37-40, July 2001. [논문 링크]
[3] 이서구, 최종성, 윤일구, “고속 3차원 매립 인덕터에 대한 모델링,” 한국 전기전자재료학회 하계학술대회, 무주, pp. 139-142, July 2001. [논문 링크]
[4] 이봉용, 정지훈, 윤일구, “경계항복 억제를 위한 평판형 InP/InGaAs 애벌랜치 포토다이오드의 곡률효과 분석", 한국 전기전자재료학회 하계학술대회, 제주, Vo1.3, No.1, pp.206-209, 2002. [논문 링크]
[5] 이봉용, 허광수, 박민철, 유정호, 이동원, 남서은, 명재민, 고대홍, 윤일구, ZrO2 유전체의 전기적 특성 모델링", 한국 전기전자재료학회 하계학술대회, 제주, Vo1.3, No.1, pp.410-413, 2002. [논문 링크]
[6] 신동욱, 오창훈, 이규복, 김종규, 윤일구, “3차원 매립형 수동소자에 대한 통계적 분석”, 한국 전기전자재료학회 하계학술대회, 제주, Vo1.3, No.2, pp.593-596, 2002. [논문 링크]
[7] 오창훈, 신동욱, 이규복, 김종규, 윤일구, “구조변화에 따른 LTCC 매립형 인덕터 등가모델 연구”, 한국 전기전자재료학회 하계학술대회, 제주, Vo1.3, No.2, pp.678-681, 2002. [논문 링크]
[8] 정지훈, 권용환, 현경숙, 윤일구, “수광영역의 식각을 통한 단일확산 공정의 고속 평판형 InP/InGaAs 10Gb/s 광 검출기의 신뢰성”, 한국 전기전자재료학회 하계학술대회, 제주, Vo1.3, No.2, pp.1022-1025, 2002. [논문 링크]
[9] 고영돈, 강홍성, 정민창, 이상렬, 명재민, 윤일구, “펄스 레이저 증착법으로 성장된 ZnO 박막의 PL 특성에 대한 신경망 모델링”, 한국 전기전자재료학회 하계학술대회, 부산, Vo1.4, No.1, pp.252-255, 2003. [논문 링크]
[10] 김명석, 고영돈, 홍장혁, 정민창, 명재민, 윤일구, “금속 유기 분자 빔 에피택시로 성장시킨 ZrO2 박막의 특성과 공정변수가 박막 성장률에 미치는 영향”, 한국 전기전자재료학회 하계학술대회, 부산, Vo1.4, No.1, pp.452-455, 2003. [논문 링크]
[11] 신동욱, 오창훈, 이규복, 김종규, 윤일구, “3차원 매립 수동소자의 특성 예측 및 분석에 대한 연구”, 한국 전기전자재료학회 하계학술대회, 부산, Vo1.4, No.2, pp.607-610, 2003. [논문 링크]
[12] 오창훈, 신동욱, 이규복, 김종규, 윤일구, “Wireless LAN을 위한 2차원 나선형 인덕터의 PEEC 모델링 기법 연구”, 한국 전기전자재료학회 하계학술대회, 부산, Vo1.4, No.2, pp.669-672, 2003. [논문 링크]
[13] 이봉용, 주한성, 윤일구, “InGaAs 도파로형 광다이오드의 암전류에 대한 열 처리 효과에 관한 연구”, 한국 전기전자재료학회 하계학술대회, 부산, Vo1.4, No.2, pp.961-964, 2003. [논문 링크]
[14] 전수창, 윤홍일, 강성호, 윤일구, “주기신호를 이용한 아날로그-디지털 변환기의 효율적인 자체고장진단 테스트 방법론”, 국내 테스팅 학회, 서울, pp.96-99, 2004. [논문 링크]
[15] 고영돈, 강흥성, 정민창, 이상렬, 명재민, 윤일구, “신경망과 유전 알고리즘을 이용한 광소자용 ZnO 박막 특성 공정 모델링 및 최적화”, 전기전자재료학회 하계학술대회, 용평, pp.33-36, 2004. [논문 링크]
[16] 김길한, 이규복, 김종규, 윤일구, “집적회로 응용을 위한 빗살형 캐패시터의 특성연구”, 전기전자재료학회 하계학술대회, 용평, pp.130-133, 2004. [논문 링크]
[17] 김명석, 고영돈, 남태형, 정민창, 명재민, 윤일구, “금속 유기 분자 빔 애피택시로 성장시킨 HfO2 박막의 특성과 공정변수가 박막의 성장 및 특성에 미치는 영향”, 전기전자재료학회 하계학술대회, 용평, pp.74-77, 2004. [논문 링크]
[18] 전수창, 주한성, 이봉용, 윤일구, “40-Gbps 급 광수신기를 위한 WGPD 서브모튤의 모델링”, 전기전자재료학회 하계학술대회, 용평, pp.154-157, 2004. [논문 링크]
[19] 주한성, 고영돈, 윤일구, “40-Gbps 급 InGaAs 도파로형 포토다이오드의 신뢰성 실험”, 전기전자재료학회 하계학술대회, 용평, pp.13-16, 2004. [논문 링크]
[20] 고영돈, 황정연, 서대식, 윤일구, “D-optimal Design을 이용한 Flexible 액정 디스플레이용 셀갭 특성에 대한 반응 표면 분석”, 전기전자재료학회 추계학술대회, 고려대, pp.510513, 2004. [논문 링크]
[21] 전수창, 주한성, 윤일구, “고속 광통신 시스템용 비대칭 분포 귀환형 레이져 다이오드의 신뢰성에 관한 연구”, 전기전자재료학회 춘계학술대회, 연세대, pp.154-157, 2005. [논문 링크]
[22] 전수창, 윤일구, “40Gbps 급 도파로형 광수신소자 submodule의 광전변환특성 모델링”, 한국 전기전자재료학회 하계학술대회, 경주, pp.79-80, 2005. [논문 링크]
[23] 이정환, 권경은, 고영돈, 문태형, 명재민, 윤일구, “HfO2 박막의 전기적 특성에 대한 통계적 모델링”, 한국 전기전자재료학회 하계학술대회, 경주, pp.223-224, 2005. [논문 링크]
[24] 송영선, 윤일구, “CMOS 이미지 센서용 n-p-n-p 적층형 색 검출기", 한국 전기전자재료학회 하계학술대회, 경주, pp.72-73, 2005. [논문 링크]
[25] 권경은, 이정환, 고영돈, 문태형, 명재민, 윤일구, “HfO2 박막 특성에 대한 신경망 모델링”, 한국 전기전자재료학회 하계학술대회, 경주, pp.240-241, 2005. [논문 링크]
[26] 안민수, 강정한, 윤일구, “고 유전율 저온 소성 세라믹으로 제작된 초고주파용 캐패시터의 특성 연구”, 한국 전기전자재료학회 하계학술대회, 경주, pp.57-58, 2005. [논문 링크]
[27] 정순일, 여현영, 윤일구, 이주인, “photoluminescence study of self-assembled InAs quantum dots with biomodel size distribution”, 한국 물리학회, 전북, pp., 2005. [논문 링크]
[28] 여현영, 정순일, 윤일구, 이주인, “Comparison of optical properties between epitaxial lateral and vertical overgrowth of GaN on patterned Si substrate”, 한국 물리학회, 전북, pp., 2005. [논문 링크]
[29] 류근호, 윤일구 “온도변화에 따른 진행파 전극형 광 변조기의 전기적 특성 변위에 관한 연구”, 한국 전기전자재료학회 하계학술대회, 무주, pp.63-64, 2006. [논문 링크]
[30] 송영선, 윤일구 “수직방향 전류를 이용한 폴리실리콘 포토다이오드에 관한 연구”, 한국 전기전자재료학회 하계학술대회, 무주, pp.75-76, 2006. [논문 링크]
[31] 안민수, 강정한, 윤일구 “저온 도시 소성세라믹으로 제작된 노출형 교차전극형 캐패시터의 특성 연구”, 한국 전기전자재료학회 하계학술대회, 무주, pp.38-39, 2006. [논문 링크]
[32] 강정한, 안민수, 윤일구 “0.35um공정을 이용하여 제작된 MOSFET의 채널 변화에 따른 특성연구”, 한국 전기전자재료학회 하계학술대회, 무주, pp.47-48, 2006. [논문 링크]
[33] 이정환, 고영돈, 강희진, 서대식, 윤일구 “신경망을 이용한 공정변수에 따른 수평 폴리머 표면의 경사각에 관한 연구”, 한국 전기전자재료학회 하계학술대회, 무주, pp.426-427, 2006. [논문 링크]
[34] 고영돈, 이정환, 함문호, 명재민, 윤일구, "HfO2 박막 특성에 대한 주성분 분석을 이용한 신경망 모델링", 2006년도 한국 표면 공학회 추계 학술 발표회, 부산, pp.8-9, 2006. [논문 링크]
[35] 송영선, 윤일구, "Investigation for Dark Current of a-Si:H p-i-n Photodiodes Fabricated by PECVD", 2007년도 한국 반도체 학술대회, 제주도, pp.239-240, 2007. [논문 링크]
[36] Pyung Moon, chang Eun Kim, Daehwan Jang, Dongji Kim, Jooho Moon, Jang Sub Kim, Soonkwon Lim, and Ilgu Yun, "Analysis of Inkjet Printing Process Using Taguchi Methodology, 한국전기전자재료학회 춘계학술대회, pp. 15~16, 2008. [논문 링크]
[37] Joon kyu Park and llgu Yun, "Simulation of High-speed InPhGaAs APDs with structural pawleter variation," 한국전기전자재료학회 하계학술대회, Vol. 9, pp. 433~434. 2008. [논문 링크]
[38] Hyuck Sang Yim, Jung Han Kang, and Ilgu Yun, "Multi-finger MOSFET characteristics with channel width variation," 한국전기전자재료학회 하계학술대회, Vol. 9, pp. 176~177. 2008. [논문 링크]
[39] 박천택, 이상명, 신동석, 윤일구, "코팅 된 투명 기판의 레이어 별 두께 측정법 연구", 대한전자공학회 하계종합학술대회, 제주도, pp. 188-189, 2015. [논문 링크]
[40] 김신애, 윤일구, 이준호 "형광신호검출 시스템용 수,발광 소자 집적 모듈 개발", 대한전자공학회 하계종합학술대회, 제주도, pp. 264-266, 2016. [논문 링크]
[41] 신용현, 윤일구 "Adjoint Method 기반 Sensitivity를 이용한 채널 도핑 농도의 변화에 따른 DG MOSFET의 구동 전류 예측 모델", 대한전자공학회 하계종합학술대회, 제주도, pp. 221-223, 2016. [논문 링크]
[42] 임준영, 윤일구 "가드링 생성 깊이에 따른 효과가 광다이오드 특성에 미치는 영향", 대한전자공학회 하계종합학술대회, 제주도, pp. 219-220, 2016. [논문 링크]