Journals

International Journals

[1] I. Yun, H. Menkara, J. Kolnik, I. Oguzman, K. Brennan, G. May, C. Summers, and B. Wagner, “Effect of Doping on the Reliability of GaAs Multiple Quantum Well Avalanche Photodiodes,” IEEE Transactions On Electron Devices, vol. 44, no. 4, pp. 535-544, April 1997.
[2] I. Yun and G. May, “Parametric Manufacturing Yield Modeling of GaAs/AlGaAs Multiple Quantum Well Avalanche Photodiodes,” IEEE Transactions On Semiconductor Manufacturing, vol. 12, no. 2, pp. 238-251, May 1999.

[3] I. Yun, L. Carastro, R. Poddar, M. Brooke, G. May, K. Hyun, and K. E. Pyun, “Extraction of Passive Device Model parameters using Genetic Algorithms," ETRI Journal, vol. 22, no. 1, pp. 38-46, March 2000.

[4] I. Yun, K. S. Hyun, “Zinc Diffusion Process Investigation of InP-based Test Structures for High-speed Avalanche Photodiode Fabrication", Microelectronics Journal, vol. 31, no. 8, pp. 635-639, August 2000.

[5] I. Yun and R. Poddar, L. Carastro, M. Brooke, and G. May, "Statistical Analysis of Embedded Capacitors using Monte Carlo Simulation," ETRI Journal, vol.23, no. 1, pp. 23-32, March 2001.

[6] E. Kim, C. Oh, S. Lee, B. Lee, I. Yun, “Modeling and Optimization of Process Parameters for GaAs/AlGaAs Multiple Quantum Well AvalanchePhotodiodes using Genetic Algorithms,” Microelectronics Journal, Vol 32/7, pp 563-567, Jul 2001.

[7] K. S. Hyun, B. S. Yoo, J. S. Kim and I. Yun, “1x8 Channel Power Splitter using Multimode Interference Coupler in InP/InGaAsP,” Jpn. J. Appl. Phys., Vol. 40 (2001) L443 Part 2, No. 5A, May 2001.

[8] J. Myoung, W. Yoon, D. Lee, I. Yun, S. Bae and S. Lee, “Effects of Thickness Variation on Properties of ZnO Thin Films Grown by Pulsed Laser Deposition,” Jpn. J. Appl. Phys., Vol. 41 (2002) Part 1, No. 1, pp. 28-31, January 2002.

[9] Seogoo Lee, Jongseong Choi, Gary S. May, and Ilgu Yun, “Modeling and Analysis of 3-D Solenoid Embedded Inductors,” IEEE Trans. Elec. Pack. Manufac., vol.25, no. 1, pp. 34-41, Jan. 2002.

[10] D. Lee, D. Moon, I. Yun, and H. Kim, “A Fault-tolerant Deadlock-free Routing Algorithm in a Meshed Network,” IEICE Trans. Inf. & Syst. Vol. E85-D, no. 4, pp. 722-726, April 2002.

[11] Bongyong Lee and Ilgu Yun, “Effect of Different Etching Processes on Edge Breakdown Suppression for Planar InP/InGaAs Avalanche Photodiodes,” Microelectronics Journal, vol.33, no. 8, pp.645-649, Aug. 2002.

[12] Young-Don Ko, Yong Hwan Kwon*, Kyung Sook Hyun**, Changhyun Yi, and Ilgu Yun, “Neural Network Based Modeling of Zinc Diffusion Process for High-Speed Avalanche Photodiodes Fabrication,” Microelectronics Journal, vol.33, no. 8, pp.675-680, Aug. 2002.

[13] Jihoun Jung, Yong Hwan Kwon*, Kyung Sook Hyun**, and Ilgu Yun, “Reliability of planar InP-InGaAs avalanche photodiodes with recess etching,” IEEE Photonics Technology Letters, vol.14, issue 8, pp.1160-1162, Aug. 2002.

[14] Young-Don Ko, Jihoun Jung, Kyu-Hyun Bang, Min-Chul Park, Kwang-Soo Huh, Jae-Min Myoung, and Ilgu Yun, “Characteristics of ZnO/Si prepared by Zn3P2 Diffusion,” Applied Surface Science, vol. 202, no. 3-4, pp. 266-271, Dec. 2002.

[15] K.H. Bang, D.k. Hwang, M.C. Park, Y.D. Ko, I. Yun and J.M. Myoung,"Formation of p-type ZnO film on InP substrate by phosphor doping," Applied Surface Science, vol. 210, no. 3-4, pp.177-182.

[16] Eun Sub Shim, Hong Seong Kang, Seong Sik Pang, Jeong Seok Kang, Ilgu Yun, Sang Yeol Lee,"Annealing effect on the structural and optical properties of ZnO film on InP," Material Science and Engineering, B102. pp.366-369, 2003.

[17] M.C.Jeong, D.K.Hwang, J.M.Myoung, Y.D.Ko, M.S.Kim, I. Yun,"The Formation of p-type ZnO films by Using a Diffusion Process," Defect and Diffusion Forum, vol. 218-220, pp.17-22, 2003.

[18] Myoung-Seok Kim, Young-Don Ko, Jang-Hyuk Hong, Min-Chang Jeong, Jae-Min Myoung, Ilgu Yun,"Characteristics and processing effects of ZrO2 thin films grown by metal-organic molecular beam epitaxy," Applied Surface Scienced, vol. 227, pp.387-398, 2004.

[19] Young-Don Ko, Yuhee Kim, Dongkwon Park, and Ilgu Yun, "Nonlinear Process Modeling using Response Surface Methodology and Variable Transformation," Robotics and Computer-Integrated Manufacturing, vol. 20, Issue 2, pp121-125, 2004.

[20] Kyung-Sook Hyun, Yong-Hwan Kown, and Ilgu Yun, "Characteristics of a Planar InP/InGaAs Avalanche Photodiode with a Thin Multiplication Layer," Journal of Korean Physics Society, vol. 44, Number 4, PP.779-784, April. 2004.

[21] Bongyong Lee, Hongil Yoon, Kyung Sook Hyun, Yong Hwan Kwon and Ilgu Yun, "Investigation of manufacturing variations of planar InP/InGaAs avalanche photodiodes for optical receivers," Microelectronics Journal, Volume 35, Issue 8, Pp 635-640, August 2004.

[22] K. H. Yoon, M. H. Shin, and C. Y. Park, I. Yun and S. J. Kim, "Edge Breakdown Suppression of 10 Gbps Avalanche Photodiode," Journal of Korean Physics Society, vol. 45, PP.936-940, Dec. 2004.

[23] Minseong Yun, Myoung-Seok Kim, Young-Don Ko, Tae-Hyoung Moon, Jang-Hyuk Hong, Jae-Min Myoung and Ilgu Yun,"Effects of post-metallization annealing of high-K dielectric thin films grown by MOMBE," Microelectronic Engineering, Vol. 77, Issue 1, pp 48-54, Jan. 2005.

[24] Young-Don Ko, Hong Seong Kang, Min-Chang Jeong, Sang Yeol Lee, Jae-Min Myoung and Ilgu Yun, "Neural network based modeling of PL intensity in PLD-grown ZnO thin films," Journal of Materials Processing Technology, Vol. 159, Issue 2, pp. 159-163, Jan. 2005.

[25] Tae-Hyoung Moon, Moon-Ho Ham, Myoung-Seok Kim, Ilgu Yun and Jae-Min Myoung, "Growth and characterization of MOMBE grown HfO2," Applied Surface Science, Vol. 240, Issues 1-4, pp. 105-111 , Feb. 2005.

[26] Byung In Moon, Hongil Yoon, Ilgu Yun, Sungho Kang, "An In-order SMT Architecture with Static Resource Partitioning for Consumer Applicatiobs," Lecture Notes in Computer Science, Springer-Verlag, Feb. 2005.

[27] H.S. Joo, S.C. Jeon, B. Lee, H. Yoon, Y.H. Kwon, J.-S. Choe, and I. Yun, "Reliability of InGaAs Waveguide Photodiodes for 40-Gb/s Optical Receivers," IEEE Trans. Device and Materials Reliability, Vol 5, Issues 2, pp. 262-267 , June. 2005.

[28] Myoung-Seok Kim, Young-Don Ko, Minseong Yun, Jang-Hyuk Hong,Min-Chang Jeong, Jae-Min Myoung, Ilgu Yun, "Characterization and Processing Effects of HfO2 Thin Films Grown by Metal-Organic Molecular Beam Epitaxy," Materials Science & Engineering B, Vol 123, Issues 1, pp. 20-30. Nov. 2005.

[29] Myoung-Seok Kim, Young-Don Ko, Tae-Hyung Moon, Jae-Min Myoung, and Ilgu Yun, "Modeling growth rate of HfO2 thin films grown by metal-organic molecular beam epitaxy," Microelectronics Journal, Vol 37, Issue 2, pp. 98-106, Feb. 2006.

[30] Kilhan Kim, Minsu Ahn, Junghan Kang, and Ilgu Yun, "Circuit Modeling of Interdigitated Capacitors Fabricated by High-K LTCC Sheets," ETRI Journal, vol.28, no.2, pp.182-190, Apr. 2006.

[31] Dongwook Shin, Changhoon Oh, Kilhan Kim, and Ilgu Yun, "Characteristic Variation of 3-D Solenoid Embedded Inductors for Wireless Communication Systems," ETRI Journal, vol.28, no.3, pp.347-354, June 2006.

[32] Jung Hwan Lee, Young-Don Ko, Min-Chang Jeong, Jae-Min Myoung, and Ilgu Yun, "PCA-Based Neural Network Modeling Using the Photoluminescence Data for Growth Rate of ZnO Thin Films Fabricated by Pulsed Laser Deposition," Lecture Notes in Computer Science, Vol. 3973, pp. 1099-1104. may. 2006.

[33] S.I.Jung, H.Y. Yeo, I. Yun, J. Y. Leem, I.K. Han, J.S. Kim, and J.I. Lee, "Photoluminescence study on the growth of self-assembled InAs quantum dots: Formation characteristics of bimodal-sized quantum dots," Physica E, pp. 280-283, May. 2006.

[34] Bongyong Lee, Su Chang Jeon, Hongil Yoon, Joong-Seon Choe, Yong Hwan Kwon, and Ilgu Yun, "Modeling O/E Characteristics of 40-Gb/s InGaAs Side-Illuminated Waveguide Photodiode Submodule for Optical Receivers," IEEE Trans. Adv. Packag., VOL. 29, NO. 3, pp. 488-495, Aug. 2006.

[35] Hee-Jin Kang, Jung Hwan Lee, Ilgu Yun, and Dae-Shik Seo, "Statistical Modeling of Pretilt Angle Generation for Nematic Liquid Crystal Using in Situ Photoalignment Method on Treated Plastic Substrate," Jpn. J. Appl. Phys., Vol. 45, No. 9A, pp. 7020-7023, Sep., 2006.

[36] Hansung Joo, Su Chang Jeon, Yong Hwan Kwon, Joong-Seon Choe, and Ilgu Yun, "Experimental Observation of the Post-Annealing Effect on the Dark Current of InGaAs Waveguide Photodiodes," Solid-State Electronics, Vol. 50, Issue 9-10, pp. 1546-1550, Sep.-Oct., 2006.

[37] Kyoung Eun Kweon, Jung Hwan Lee, Young-Don Ko, Min-Chang Jeong, Jae-Min Myoung, and Ilgu Yun, "Neural Network based Modeling of HfO2 Thin Film Characteristics using Latin Hypercube Sampling," Expert Sys. Appl., Vol. 32, Issue 2, pp. 358-363, Feb., 2007.

[38] S. I. Jung, H. Y. Yeo, I. Yun,I. K. Han, S. M. Cho, and J. I. Lee, "Near-Field Emission Properties of a Self-Formed InAs Quantum Dot Laser Diode by Using Near-Field Scanning Optical Microscopy," Journal of the Korean Physical Society, Vol. 50, No. 3, pp. 763-766, March 2007.

[39] S. I. Jung, H. Y. Yeo, I. Yun, J. Y. Leem, S. M. Cho, J. S. Kim, and J. I. Lee, "High Potential Barrier Effects on Self-Assembled InAs Quantum Dots," Journal of the Korean Physical Society, Vol. 50, No. 3, pp. 767-770, March 2007.

[40] H. Y. Yeo, S. I. Jung, I. Yun, J. I. Lee, I. K. Han, and S. M. Cho, "The Optical Characteristics of Epitaxial Lateral and Vertical Overgrowth of GaN on Stripe-Patterned Si Substrate," Journal of the Korean Physical Society, Vol. 50, No. 3, pp. 771-775, March 2007.

[41] Han Sung Joo, Sang-Wan Ryu, Jeha Kim and Ilgu Yun, "Degradation analysis in asymmetric sampled grating distributed feedback laser diodes," Microelectronics Journal, Vol. 38, Issues 6-7, PP. 740-745, June-July 2007.

[42] S. I. Jung, H. Y. Yeo, I. Yun, J. Y. Leem, I. K. Han, J. S. Kim and J. I. Lee, "Size distribution effects on self-assembled InAs quantum dots," Mater Sci - Mater Electron, vol.18, page.S191-S194, October 2007.

[43] S. I. Jung, H. Y. Yeo, I. Yun, J. Y. Leem, I. K. Han, J. S. Kim and J. I. Lee, "Near-field scanning optical microscopy of quantum dot broad area laser diodes," Mater Sci - Mater Electron, vol.18, page.S195-S199, October 2007.

[44] Soon Il Jung, and Ilgu Yun, "Fabrication and Optical Properties of CdSe/ZnS Core/Shell Quantum-Dot Multilayer Film and Hybrid Organic/Inorganic Light-Emitting Diodes Fabricated by Using Layer-by-Layer Assembly," Joural of the korean Physical Society, Vol. 52, No. 6, pp. 1891~1894, June 2008.

[45] Jung Hwan Lee, Kyoung Eun Kweon, Young-Don Ko, Tae-Hyoung Moon, Jae-min Myoung, and Ilgu Yun, "Statistical modeling of the electrical characteristics for HfO2 thin films grown by MOMBE for high-k dielectric applications," Journal of Materials Processing Technology 203, pp. 454~460, July 2008.

[46] Soon Il Jung, Hyun young yeo, Ilgu Yun, Sung M. Cho, Il ki Han, and Joo In Lee, "Optical Characteristics of CdSe Quantum Dots Depending on Growth Conditions and Surface Passivation," Journal of Nanoscience and Nanotechnology, Vol. 9, No. 9, pp. 4899~4902, September 2008.

[47] Jung Hwan Lee, Dong-Hun Kang, Young-Don Ko, Jaejin Jang, Dae-Shik Seo, and Ilgu yun, "Neural network modeling of eht cellgap process for liquid crystal display fabricated on plastic substrates," Elsevier, Expert Systems with Applications Vol. 35, Issue 3, pp. 1311~1315, October 2008.

[48] Youngdon Ko, and Ilgu yun, "Investigation of cell gap on the polymer using statistical modelling for flexible liquid crystalsubstrates display applications," International Journal of Nanomanufacturing Vol. 2, Issue 4, pp. 361~374, December 2008.

[49] Keunho Rhew, Suchang Jeon, and Ilgu yun, "Reliability assessment of 1.55-μm vertical cavity surface emitting lasers with tunnel junction using high-temperature aging tests," Microelectronics Reliability Vol. 49, Issue 1, pp. 42~50, January 2009.

[50] Youngdon Ko, Changeun Kim, Pyung Moon, and Ilgu Yun, "Modeling and optimization of the growth rate for ZnO thin films using neural networks and genetic algorithms," Expert Systems with Applications Vol. 36, Issue 2, pp. 4061~4066, March 2009.

[51] Soonil Jung, Ilgu Yun, Joo In Lee, Il Ki Han, "Optical properties of self-assembled InAs quantum-dot superluminescent diodes", Journal of the Korean Physical Society Vol. 55, No. 1, pp. 24~27, July 2009.

[52] Soonil Jung, and Ilgu yun, "Photoluminescence study of InGaN/GaN multiple-quantum-well with Si-doped InGaN electron-emitting Layer," Current Applied Physics Vol. 9, Issue 5, pp. 943~945, September 2009.

[53] Chang Eun Kim, Hyun Soo Shin, Pyung Moon, Hyun Jae Kim, Ilgu Yun, "Modeling of In2O3-10 wt% ZnO thin film properties for transparent conductive oxide using neural networks", Current Applied Physics Vol. 9, Issue 6, pp. 1407~1410, November 2009.

[54] Doyoung Kim, Ilgu Yun, Hyungjun Kim, "Fabrication of rough Al doped ZnO films deposited by low pressure chemical vapor deposition for high efficiency thin film solar cells", Current Applied Physics Vol. 10, Issue 3, pp. S459-S462, May 2010.

[55] Chang Eun Kim, Pyung Moon, Ilgu Yun, Sungyeon Kim, Jae-Min Myoung, Hyeon Woo Jang, Jungsik Bang, "Optical bandgap modeling of thermal annealed ZnO:Ga thin films using neural networks ", Physica Status Solidi (a) Vol. 207, Issue 7, pp. 1572~1576, July 2010.

[56] Chang Eun Kim, Pyung Moon, Sungyeon Kim, Jae-Min Myoung, Hyeon Woo Jang, Jungsik Bang, Ilgu Yun, "Effect of carrier concentration on optical bandgap shift in ZnO:Ga thin films ", Thin Solid Films Vol. 518, Issue 22, pp. 6304~6307, September 2010.

[57] Chang Eun Kim, Edward Namkyu Cho, Pyung Moon, Gun Hee Kim, Dong Lim Kim, Hyun Jae Kim, and Ilgu Yun, "Density of States Modeling of Solution Processed InGaZnO Thin Film Transistors", IEEE Electron Device Letters, Vol. 31, Issue 10, pp. 1131~1133, October 2010.

[58] Kyeong-Ju Moon, Tae-Il Lee, Ji-Hyuk Choi, Joohee Jeon, Youn Hee Kang, Jyoti Prakash Kar, Jung Han Kang, Ilgu Yun, and Jae-Min Myoung, " One Dimensional Semiconductor Nanostructure Based Thin Film Partial Composite Formed by Transfer Implantation for High Performance Flexible and Printable Electronics at Low Temperature", ACS Nano, Vol. 5, No. 1, pp.159-164, January 2011.

[59] Chang Eun Kim, Pyung Moon, Sungyeon Kim, Jae-Min Myoung, Hyeon Woo Jang, Jungsik Bang, and Ilgu Yun, " Process Estimation and Optimized Recipes of ZnO:Ga Thin Film Characteristics for Transparent Electrode Applications", Expert Systems with Applications, Vol. 38, Issue 3, pp. 2823-2827, March 2011.

[60] Edward Namkyu Cho, Jung Han Kang, Chang Eun Kim, Pyung Moon, and Ilgu Yun, "Analysis of Bias Stress Instability in Amorphous InGaZnO Thin-Film Transistors", IEEE Transactions on Device and Materials Reliability, Vol. 11, No. 1, pp. 112-117, March 2011.  

[61] Chulhyun Park,Youngkyu Song, Junghan Kang, Seong-Ook Jung, Ilgu Yun, "Effects of Non-Rectangular Gate Structures on the Electrical Characteristic Variations for the Multi-finger MOSFETs," IEEE Transactions on Components, Packaging and Manufacturing Technology, Vol. 1, No. 3,pp. 352-358, March 2011.

[62] Edward Namkyu Cho, Jung Han Kang, and Ilgu Yun " Contact resistance dependent scaling-down behavior of amorphous InGaZnO thin-film transistors ," Current Applied Physics, Vol. 11, No. 4, pp. 1015-1019, July 2011. 

[63] Hyonik Lee, Min Su Kim, Jungmok Seo, Ja Hoon Koo, Taeyoon Lee, Edward Namkyu Cho, Ilgu Yun, and Taeyoon Lee, "Si/Si 1-x Ge x /Si heterojunction PIN nanowires fabricated by an aqueous electroless etching method," Journal of the Korean Physical Society, Vol. 59, No. 2, pp. 501-504, August 2011.

[64] Edward Namkyu Cho, Jung Han Kang, and Ilgu Yun, "Effects of channel thickness variation on bias stress instability of InGaZnO thin-film transistors," Microelectronics Reliability, Vol. 51, No. 9-11, pp. 1792-1795, Sep.-Nov. 2011.

[65] Chang Eun Kim, and Ilgu Yun*, "Effects of the Interfacial Layer on Electrical Characteristics of Al2O3/TiO2/Al2O3 Thin Films for Gate Dielectrics," Applied Surface Science, Vol. 258, Issue 7, pp. 3089-3093, January 2012.

[66] Chang Eun Kim, and Ilgu Yun*, "Effects of Nitrogen Doping on Device Characteristics of InSnO Thin Film Transistor," Applied Physics Letters, Vol. 100, Issue 1, pp. 013501, January 2012.

[67] Edward Namkyu Cho, Pyung Moon, Chang Eun Kim, and Ilgu Yun*, "Modeling and optimization of ITO/Al/ITO multilayer films characteristics using neural network and genetic algorithm," Expert Systems with Applications, Vol. 39, Issue 10, pp. 8885-8889, August. 2012.

[68] Suehye Park, Edward Namkyu Cho, and Ilgu Yun, "Investigation on the relationship between channel resistance and subgap density of states of amorphous InGaZnO thin film transistors," Solid-State Electronics, Vol. 75, pp. 93-96, September 2012.

[69] Edward Namkyu Cho, Suehye Park, and Ilgu Yun, "Spectroscopic ellipsometry modeling of ZnO thin films with various O 2 partial pressures," Current Applied Physics, Vol. 12, Issue 6, pp. 1606-1610, November 2012.

[70] Mingu Kang and Ilgu Yun, "Experimental observation of gate geometry dependent characteristic degradations of the multi-finger MOSFETs," Microelectronics Reliability, Vol. 52, Issue 9-10, pp. 1936-1939, September-October 2012.

[71] Suehye Park, Edward Namkyu Cho, and Ilgu Yun, "Threshold voltage shift prediction for gate bias stress on amorphous InGaZnO thin film transistors," Microelectronics Reliability, Vol. 52, Issue 9-10, pp. 2215-2219, September-October 2012.

[72] Chang Eun Kim and Ilgu Yun, "Device characteristics of InSnO thin-film transistors with a modulated channel," Semiconductor Science and Technology, Vol. 27, Issue 12, pp. 125006, December 2012.

[73] Suehye Park, Edward Namkyu Cho, and Ilgu Yun, "Channel Length-Dependent Charge Detrapping on Threshold Voltage Shift of Amorphous InGaZnO TFTs Under Dynamic Bias Stress," IEEE Transactions on Electron Devices, Vol. 60, No. 5, May 2013.

[74] Young-Don Ko, Pyung Moon, Chang Eun Kim, Moon-Ho Ham, Myong-Kee Jeong, Alberto Garcia-Diaz, Jae-Min Myoung, and Ilgu Yun,"Predictive Modeling and Analysis of HfO2 Thin Film Process Based on Bayesian Information Criterion Using PCA-based Neural Networks," Surface and Interface Analysis, May 2013.

[75] Chang Eun Kim and Ilgu Yun, "Device Characteristics of Ti-InSnO Thin Film Transistors with Double and Triple Channel Structures," Thin Solid Films, Vol 537, pp.275-278, June 2013.

[76] Edward Namkyu Cho, Yong Hyeon Shin, and Ilgu Yun, "Channel doping-dependent analytical model for symmetric double gate metal-oxide-semiconductor field-effect transistor- Part I: Extraction of subthreshold characteristics," Journal of Applied Physics, Vol 113, Issue 21, pp.214506_1-7, June 2013.

[77] Edward Namkyu Cho, Yong Hyeon Shin, and Ilgu Yun, "Channel doping-dependent analytical model for symmetric double gate metal-oxide-semiconductor field-effect transistor- Part II: Continuous drain current model from subthreshold to inversion region," Journal of Applied Physics, Vol 113, Issue 21, pp.214507_1-5, June 2013.

[78] Jung Han Kang, Edward Namkyu Cho, Chang Eun Kim, Min-Jung Lee, Su Jeong Lee, Jae-Min Myoung and Ilgu Yun, "Mobility Enhancement in Amorphous InGaZnO Thin-Film Transistors by Ar Plasma Treatment,"  Applied Physics Letters, Vol 102, Issue 22, pp.222103_1-3, June 2013.

[79] Pyung Moon, Jun Yeong Lim, Tae-Un Youn, Keum-Whan Noh, Sung-Kye Park, and Ilgu Yun, "Methodology for improvement of data retention in floating gate flash memory using leakage current estimation,"  Microelectronics Reliability, Vol 53, Issue 9-11, pp.1338-1341, November 2013.

[80] Suehye Park, Edward Namkyu Cho, and Ilgu Yun, "Instability of light illumination stress on amorphous In-Ga-Zn-O thin-film transistors,"  Journal of the Society for Information Display, Vol 21, Issue 8, pp.333-338, August 2013.

[81] Pyung Moon, Jun Yeong Lim, Tae-un Youn, Sung-Kye Park and Ilgu Yun, "Field-Dependent Charge Trapping Analysis of ONO Inter-poly Dielectrics for NAND Flash Memory Applications," Solid-State Electronics, Vol 94, pp. 51-55, April 2014.

[82] Jun Han Kang, Edward Namkyu Cho and Ilgu Yun, "Conduction instability of amorphous InGaZnO thin-film transistors under constant drain current stress", Microelectronics Reliability, Vol 54, pp. 2164-2166, September 2014.

[83] Edward Namkyu Cho, Yong Hyeon Shin and Ilgu Yun, "A compact quantum correction model for symmetric double gate metal-oxide-semiconductor field-effect transistor", Journal of Applied Physics, Vol 116, Issue 17, pp.174507_1-5, November 2014.

[84] Sang Hoon Lee, Tae Il Lee, Su Jeong Lee, Sang Myung Lee, Ilgu Yun and Jae Min Myung, "Electrical Characteristics of Metal Catalyst-Assisted Etched Rough Silicon Nanowire Depending on the Diameter Size", ACS Applied Materials & Interfaces , Vol 7, pp. 929-934, January 2015.

[85] Edward Namkyu Cho, Yong Hyeon Shin and Ilgu Yun, "An analytical avalanche breakdown model for double gate MOSFET", Microelectronics Reliability, Vol 55, pp. 38-41, January 2015.

[86] Seon Yeong Kim, Yoon Ho Jung, Min-Jae Cho, Jae-Won Lee, Hong-Gyu Park, Dai-Hyun Kim, Tae Wan Kim, Ilgu Yun and Dae-Shik Seo, "UV-Cured Reactive Maesogen-YInZnO Hybrid Materials as Semiconducting Channels in Thin-Film Transistors Using a Solution-Process", ECS Solid State Letters, Vol 4, Issue 3, pp. 22-24, January 2015.

[87] Pyung Moon, Jun Yeong Lim, Tae-Un Youn, Keum-Whan Noh and Ilgu Yun, "Effect of electric field polarity on inter-poly dielectric during cell operation for the retention characteristics", Microelectronics Reliability, Vol 55, Issue 5, pp. 795-798, April 2015.

[88] Jihyun Ka, Edward Namkyu Cho, Min-Jung Lee, Jae-Min Myung and Ilgu Yun, "Electrode metal penetration of amorphous indium gallium zinc oxide semiconductor thin film transistors", Current Applied Physics, Vol 15, pp. 675-678, June 2015.

[89] Young Bok Lee, Il-Kwon Oh, Edward Namkyu Cho, Pyung Moon, Hyungjun Kim and Ilgu Yun, "Characterization of HfOxNy thin film formation by in-situ plasma enhanced atomic layer deposition using NH3 and N2 plasmas", Applied Surface Science, Vol 349, pp. 757-762, September 2015.

[90] Jun Yeong Lim, Pyung Moon, Sang Myung Lee, Keum-Whan Noh, Tae-Un Youn, Jong-Wook Kim and Ilgu Yun, "Analysis of intrinsic charge loss mechanisms for nanoscale NAND flash memory", IEEE Transactions on Device and Materials Reliability, Vol 15, No 3, pp. 319-325, September 2015.

[91] Jun Yeong Lim and Ilgu Yun, "Reliability modeling and analysis of flicker noise for pore structure in amorphous chalcogenide-based phase-change memory devices", Microelectronics Reliability, Vol 55, Issue9-10, pp. 1320-1322, September 2015.

[92] Jiyeon Park, Hong Joo Song, Hong Man Na, Jun Ho Lee and Ilgu Yun, "Design of red-emitting external cavity diode laser module for high-slope efficiency and narrow bandwidth", Optical Engineering, Vol 54, Issue 9, p. 096109, September 2015.

[93] Yong Hyeon Shin and Ilgu Yun, "Analytical model for an asymmetric double-gate MOSFET with gate-oxide thickness and flat-band voltage variations in the subthreshold region", Solid-State Electronics, Vol 120, pp. 19-24, June 2016.

[94] In Joong Kim and Ilgu Yun, "Plasma Process Uniformity Diagnosis Technique Using Optical Emission Spectroscopy With Spatially Resolved Ring Lens", IEEE Transactions on Industrial Electronics, Vol 63, No. 9, pp. 5674-5681, September 2016.

[95] Dongseok Shin, Min Soo Bae, and Ilgu Yun, "Instability of oxide thin film transistor under electrical-mechanical hybrid stress for foldable display", Microelectronics Reliability, Vol 64, pp. 109-112, September 2016.

[96] Sang Myung Lee, Chuntaek Park, and Ilgu Yun, "Crack-guided effect on dynamic mechanical stress for foldable low temperature polycrystalline silicon thin film transistors", Microelectronics Reliability, Vol 64, pp. 84-87, September 2016.

[97] Yong Hyeon Shin, and Ilgu Yun, "Analytical model for random dopant fluctuation in double-gate MOSFET in the subthreshold region using macroscopic modeling method", Solid State Electronics, Vol 126, pp. 136-142, December 2016.

[98] Sang Myung Lee, Dongseok Shin, and Ilgu Yun, "Degradation Mechanisms of Amorphous InGaZnO Thin-Film Transistors Used in Foldable Displays by Dynamic Mechanical Stress", IEEE Transactions on Electron Devices, Vol 64, pp. 170-175, January 2017.

[99] Yong Hyeon Shin, Sungwoo Weon, Daesik Hong and Ilgu Yun, "Analytical model for junctionless double-gate FET in subthreshold region", IEEE Transactions on Electron Devices, Vol 64, NO. 4, April 2017.

[100] Min Soo Bae, Chuntaek Park, Dongseok Shin, Sang Myung Lee and Ilgu Yun, "Effects of mechanical stresses on the reliability of low-temperature polycrystalline silicon thin film transistors for foldable displays", Solid-State Electronics, Vol 133, pp. 1-5, July 2017.

[101] Sang Myung Lee, and Ilgu Yun, "Effect of selectively passivated layer on foldable low temperature polycrystalline silicon thin film transistors characteristics under dynamic mechanical stress", Microelectronics Reliability, Vol 76-77, pp. 606-609, September. 2017.

[102] Dongseok Shin, Byungchoul Park, Youngcheol Chae, and Ilgu Yun, "Structure variation effects on device reliability of single photon avalanche diodes", Microelectronics Reliability, Vol 76-77, pp. 610-613, September. 2017.

[103] Chuntaek Park, and Ilgu Yun, "Mechanical stress-induced degradation model of amorphous InGaZnO thin film transistors by strain-initiated defect generation", Microelectronics Reliability, Vol 76-77, pp. 592-595, September. 2017.

[104] Yong Hyeon Shin, Min Soo Bae, Chuntaek Park, Joung Won Park, Hyunwoo Park, Yong Ju Lee and Ilgu Yun, "Universal core model for multiple-gate field-effect transistors with short channel and quantum mechanical effects", Semiconductor Science and Technology, Volume 33, Number 6, May 2018.

[105] In Joong Kim, and Ilgu Yun, "Real-time plasma monitoring technique using incident-angle-dependent optical emission spectroscopy for computer-integrated manufacturing, Robotics and Computer-Integrated Manufacturing", Volume 52, Pages 17-23, August 2018.

[106] Chuntaek Park, and Ilgu Yun, "Thermal modeling of 7nm node bulk fin-shaped field-effect transistors for device structure-aware design", Semiconductor Science and Technology, Volume 33, Number 11, October 2018.

[107] In Joong Kim, and Ilgu Yun, "Real-time Plasma Uniformity Measurement Technique Using Optical Emission Spectroscopy with Revolving Module", IEEE Sensors Journal, Volume 19, Issue 6, pp. 2356-2361, March 2019.

[108] Min Soo Bae, and Ilgu Yun. "Compact modeling of the subthreshold characteristics of junctionless double-gate FETs including the source/drain extension regions." Solid-State Electronics, Vol 156, pp. 48-57, June 2019.

[109] Dongseok Shin, Byungchoul Park, Youngcheol Chae, and Ilgu Yun, "The Effect of a Deep Virtual Guard Ring on the Device Characteristics of Silicon Single Photon Avalanche Diodes", IEEE Transactions on Electron Devices, Vol 66, pp. 2986-2991, July 2019.

[110] Min Soo Bae, and Ilgu Yun, "Impact of process variability in junctionless FinFETs due to random dopant fluctuation, gate work function variation, and oxide thickness variation", Semiconductor Science and Technology, Volume 35, Number 3, February 2020.

[111] Chuntaek Park, and Ilgu Yun, "Degradation of off-phase leakage current of FinFETs and Gate-all-around FETs induced by the self-heating effect in the high-frequency operation regime", IEEE Transactions on Nanotechnology, Volume 19, Issue 1, April 2020.

[112] Min Soo Bae, and Ilgu Yun, "Unified compact model for junctionless multiple-gate FETs including source/drain extension regions", Physica Scripta, accepted on October 2020.

[113] In Joong Kim, Chuntaek Park, Dongseok Shin, and Ilgu Yun, "Real-Time Plasma Uniformity Monitoring via Selective Plasma Light Intensity Measurement Using Transparent-LCD-Module-Adapted Optical Emission Spectroscopy", IEEE Sensors Journal, Vol 21, Issue 2, 2020.

[114] Min Soo Bae and Ilgu Yun, “2-D Quantum Confined Threshold Voltage Shift Model for Asymmetric Short-Channel Junctionless Quadruple-Gate FETs,” IEEE Trans. Electron Devices, vol. 68, no.11, pp. 5504-5510, 2021.

[115]Chuntaek Park and Ilgu Yun, “Optimization of Self-Heating Driven Leakage Current Proper- ties of Gate-All-Around Field-Effect Transistors Using Neural Network Modeling and Genetic Algorithm,” Electronics, October 2021.

[116] Hyejeong Choi, Chan Yong  Park, Soo Hyun Baek, Gap Yeal Moon, and Ilgu Yun, “Evaluation of the Long-Term Reliability of Open-Tube Diffused Planar InGaAs/InP Avalanche Photodiodes under a Hybrid of Thermal and Electrical Stresses,” Electron., vol. 11, no. 5, 2022.

[117] Haewon Lee, Hyejeong Choi and Ilgu Yun, "Junction Engineering based Modeling and Optimization of Deep Junction Silicon Single-Photon Avalanche Diodes for Device Scaling", IEEE Transactions on Electron Devices, vol. 69, Issue. 9, pp 4970-4985, 2022.

[118] D. Kim, S. Na, H. Kim, and I. Yun, “Methodology for Plasma Diagnosis and Accurate Virtual Measurement Modeling Using Optical Emission Spectroscopy,” IEEE Sens. J., vol. 23, no. 8, pp. 8867–8875, 2023, doi: 10.1109/JSEN.2023.3251343.

[119] H. Lee and I. Yun, “TFET-Based Pixel Source Follower of CMOS Image Sensor for Improved Linearity and High Signal-to-Noise Ratio,” IEEE Sens. J., vol. PP, no. Xx, p. 1, 2023, doi: 10.1109/JSEN.2023.3296518.

[120] Semyung Kwon and Ilgu Yun, “Asymmetric and Double-Layered Gate-All-Around Structures of 1T-DRAM for Sensing Margin and Retention Improvement”, IEEE Transactions on Electron Devices, vol. 71, Issue. 6, pp 3627-3632, 2024.

Domestic Journals

[1] I. Yun, K. S. Hyun, Y. W. Kwon, K. E. Pyun, “Examination of Diffusion Porcess for High-speed Avalanche Photodiode Fabrication”, J. KIEEME, vol. 13, no. 11, pp. 954-958, Nov. 2000.

[2] 김의승, 오창훈, 이서구, 이상렬, 명재민, 윤일구, “유전 알고리즘을 이용한 다중 양자 우물 구조의 갈륨비소 광수신소자 공정변수의 최적화,” J. KIEEME, vol. 14, no. 3, pp. 241-245, March 2001.

[3] 배상혁, 윤일구, 서대식, 명재민, 이상렬, “PLD 증착 변수에 따른 II-VI족 화합물 ZnO 반도체 박막의 발광 특성 연구,” J. KIEEME, vol. 14, no. 3, pp. 246-250, March 2001.

[4] 윤욱희, 명재민, 이동희, 배상혁, 윤일구, 이상렬, “PLD 법에 의해 제조된 ZnO 박막의 두께 변화에 따른 특성 연구,” 한국 재료학회 논문지, vol. 11, no. 4, pp.319-323, 2001.

[5] 이서구, 최종성, 윤일구, “저온 동시소성 공정으로 제작된 3차원 매립 인덕터 모델링,” J. KIEEME, vol. 15, no. 4, pp. 344-348, April 2002.

[6] 신동욱, 오창훈, 이규복, 김종규, 윤일구, “부분등가회로모델을 이용한 매립형 인덕터의 특성 연구,” J. KIEEME, vol. 16, no. 5, pp. 404-408, May 2003.

[7] H.-J. Kang, J. H. Lee, I. Yun, and D.-S. Seo, "Statistical Modeling of Pretilt Angle Control in nematic liquid crystal using in-situ photoalignment method on plastic substrate," Transactions on Electrical and Electronic Materials, Vol. 7, No. 3, pp. 145-148, June, 2006.

[8] H.-J. Kang, J. H. Lee, J.-Y. Hwang, I.G. Yun, and D.-S. Seo, "Statistical Modeling of Pretilt Angle Control on the Homogeneous Polyimide Surface as a Function of Rubbing Strength and Baking Temperature," Transactions on Electrical and Electronic Materials, Vol. 7, No. 2, pp. 81-86, April 2006.

[9] Jung Hwan Lee, Young-Don Ko, Kyounghee Han and Ilgu Yun, "Comparison of Latin Hypercube Sampling and Simple Random Sampling Applied to Neural Network Modeling of HfO2 Thin Film Fabrication," Transactions on Electrical and Electronic Materials, Vol. 7, No. 4, pp. 210-214, Aug., 2006.

[10] Young-Don Ko, Kilhan Kim, Kyubok Lee, Jongkyu Kim and Ilgu Yun, “Piecewise Regression Model for Solenoid Embedded Inductors based on the Quasi-Newton Method“ / Transactions on Electrical and Electronic Materials / vol. 6, no. 6, 15 Dec 2005.

[11] 정순일, 여현영, 윤일구, 한일기, 이주인, “이중크기분포를 가지는 자발형성 InAs 양자점의 광 특성평가“ Journal of the Korean Vacuum Society 2006.

[12] Young-Don Ko, Pyung Moon, Moon-Ho Ham, Jae-Min Myoung, and Ilgu Yun, "Process Effect on the RMS Roughness of HfO2 Thin Films Grown by MOMBE," Transactions on Electrical and Electronic Materials, Vol. 8, No. 2, pp. 58-66, April, 2007.

[13] Mingu Kang, Ilgu Yun*, "Modeling of Electrical Characteristics for Multi-finger MOSFETs with Drain Voltage Variation," Transactions on Electrical and Electronic Materials, Vol. 12, No. 6, pp. , December 25, 2011.